Insize 3240-75 Depth Micrometer 0-75mm Range ±3μm Accuracy with Carbide-Tipped Faces

The Insize 3240-75 Depth Micrometer is a precision measuring instrument designed for accurate measurement of depths in holes, slots, and recesses. With a measurement range of 0mm to 75mm and an accuracy of ±3μm, this micrometer is ideal for applications in manufacturing, engineering, and quality control, ensuring reliable and precise depth measurements for medium-sized components.

Key Features:

• Measurement Range:

  • Provides a measurement range from 0mm to 75mm, making it versatile for a variety of depth measurement tasks in small to medium-sized components.

• High Accuracy:

  • Offers high precision with an accuracy of ±3μm, ensuring reliable and accurate measurements for tasks requiring tight tolerances.

• Carbide-Tipped Measuring Faces:

  • The carbide-tipped measuring faces provide enhanced durability and wear resistance, ensuring long-lasting accuracy even with frequent use.

• Adjustable Base:

  • Comes with an adjustable base for easy alignment and accurate depth measurements, ensuring consistent and repeatable results.

• Clear and Easy-to-Read Scale:

  • The micrometer features a clear, easy-to-read scale, enabling quick and accurate readings during measurement tasks.

• Ratchet Stop for Consistent Pressure:

  • The ratchet stop mechanism ensures consistent measuring pressure, preventing over-tightening and enhancing measurement repeatability.

• Durable Construction:

  • Made from high-quality materials to ensure long-term durability and reliable performance in demanding industrial environments.

Technical Specifications:

• Measuring Range: 0-75mm
• Accuracy: ±3μm
• Resolution: 0.01mm
• Measuring Faces: Carbide-tipped for enhanced durability and wear resistance
• Base: Adjustable for accurate alignment and precise measurements
• Ratchet Stop: Yes, for consistent and uniform measuring pressure
• Material: Hardened steel construction for durability
• Standard Compliance: Complies with international precision measurement standards